The lifetime of the surface plasmon in sputtered Ag ultrathin films on Cu(111) was investigated by high-resolution electron energy loss spectroscopy measurements. The linewidth of the surface plasmon was found to follow a square-root dependence on the fluence. Such finding allows the tuning of the lifetime of the plasmonic excitation upon sputtering and has general implications in plasmon-based spectroscopies and in plasmon- mediated processes across the films and at their surfaces.
Tuning the lifetime of the surface plasmon upon sputtering
CHIARELLO, Gennaro
2009-01-01
Abstract
The lifetime of the surface plasmon in sputtered Ag ultrathin films on Cu(111) was investigated by high-resolution electron energy loss spectroscopy measurements. The linewidth of the surface plasmon was found to follow a square-root dependence on the fluence. Such finding allows the tuning of the lifetime of the plasmonic excitation upon sputtering and has general implications in plasmon-based spectroscopies and in plasmon- mediated processes across the films and at their surfaces.File in questo prodotto:
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