Sfoglia per Rivista IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
Mostrati risultati da 1 a 6 di 6
1/f Noise in Drain and Gate Current of MOSFETs With High-k Gate Stacks
2009-01-01 Magnone, P; Crupi, Felice; Giusi, G; Pace, Calogero; Simoen, E; Claeys, C; Pantisano, L; Maji, D; Rao, Vr; Srinivasan, P.
A comparative study of the oxide breakdown in short-channel nMOSFETs and pMOSFETs stressed in inversion and in accumulation regimes
2003-01-01 Crupi, Felice; Kaczer, B; Degraeve, R; De Keersgieter, A; Groeseneken, G.
A Defect-Centric Analysis of the Temperature Dependence of the Channel Hot Carrier Degradation in nMOSFETs
2016-01-01 Procel, Lm; Crupi, Felice; Trojman, L; Franco, J; Kaczer, B.
Impact of the Substrate Orientation on CHC Reliability in n-FinFETs – Separation of the Various Contributions
2014-01-01 Tallarico, An; Cho, M; Franco, J; Ritzenthaler, R; Togo, M; Horiguchi, N; Groeseneken, G; Crupi, Felice
Implications of the Incremental Pulse and Verify Algorithm on the Forming and Switching Distributions in RERAM Arrays
2016-01-01 Crupi, Felice; Filice, F; Grossi, A; Zambelli, C; Olivo, P; Perez, E; Wenger, C.
Single Defect Discharge Events in Vertical-Nanowire Tunnel-FETs
2017-01-01 Fiore, A; Franco, J; Cho, M; Crupi, Felice; Strangio, S; Roussel, Phj; Rooyackers, R; Colvert, N; Linten, D.
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| 1/f Noise in Drain and Gate Current of MOSFETs With High-k Gate Stacks | 1-gen-2009 | Magnone, P; Crupi, Felice; Giusi, G; Pace, Calogero; Simoen, E; Claeys, C; Pantisano, L; Maji, D; Rao, Vr; Srinivasan, P. | |
| A comparative study of the oxide breakdown in short-channel nMOSFETs and pMOSFETs stressed in inversion and in accumulation regimes | 1-gen-2003 | Crupi, Felice; Kaczer, B; Degraeve, R; De Keersgieter, A; Groeseneken, G. | |
| A Defect-Centric Analysis of the Temperature Dependence of the Channel Hot Carrier Degradation in nMOSFETs | 1-gen-2016 | Procel, Lm; Crupi, Felice; Trojman, L; Franco, J; Kaczer, B. | |
| Impact of the Substrate Orientation on CHC Reliability in n-FinFETs – Separation of the Various Contributions | 1-gen-2014 | Tallarico, An; Cho, M; Franco, J; Ritzenthaler, R; Togo, M; Horiguchi, N; Groeseneken, G; Crupi, Felice | |
| Implications of the Incremental Pulse and Verify Algorithm on the Forming and Switching Distributions in RERAM Arrays | 1-gen-2016 | Crupi, Felice; Filice, F; Grossi, A; Zambelli, C; Olivo, P; Perez, E; Wenger, C. | |
| Single Defect Discharge Events in Vertical-Nanowire Tunnel-FETs | 1-gen-2017 | Fiore, A; Franco, J; Cho, M; Crupi, Felice; Strangio, S; Roussel, Phj; Rooyackers, R; Colvert, N; Linten, D. |
Mostrati risultati da 1 a 6 di 6
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