An indirect approach for estimating the long term stability of DC electrical sources from low frequency noise measurements is presented and discussed. In particular, it is demonstrated that once the unity frequency magnitude and the frequency exponent of the flicker noise component are determined, an overestimate of the variance of repeated measurements of the source output (averaged over a time interval τ) taken δT seconds apart can be readily obtained. The proposed approach is validated with reference to actual experimental data.
Long-term stability estimation of DC electrical source from low-frequency noise measurements
PACE, Calogero
2004-01-01
Abstract
An indirect approach for estimating the long term stability of DC electrical sources from low frequency noise measurements is presented and discussed. In particular, it is demonstrated that once the unity frequency magnitude and the frequency exponent of the flicker noise component are determined, an overestimate of the variance of repeated measurements of the source output (averaged over a time interval τ) taken δT seconds apart can be readily obtained. The proposed approach is validated with reference to actual experimental data.File in questo prodotto:
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