We observe with an atomic force microscope (AFM) the surface of a rough substrate that gives bistable anchoring for typical nematic liquid crystals. This surface is obtained by oblique evaporation of a thin film of SiO (average thickness approximately 150 angstrom) on a smooth glass plate. It appears highly disordered and exhibits very small structures with a typical horizontal size of 500 angstrom and a typical vertical size of 200 angstrom. The fractal properties of the AFM data acquired indicate that the growth process of the substrate SiO structures is governed by a diffusion law. It is reasonable to expect a decrease of the surface order parameter for the interface layer of a liquid crystal close to this kind of substrate.
AFM EXPERIMENTAL-OBSERVATION AND FRACTAL CHARACTERIZATION OF AN SIO-COATED PLATE FOR NEMATIC BISTABLE ANCHORING
BARBERI, Riccardo Cristoforo;
1994-01-01
Abstract
We observe with an atomic force microscope (AFM) the surface of a rough substrate that gives bistable anchoring for typical nematic liquid crystals. This surface is obtained by oblique evaporation of a thin film of SiO (average thickness approximately 150 angstrom) on a smooth glass plate. It appears highly disordered and exhibits very small structures with a typical horizontal size of 500 angstrom and a typical vertical size of 200 angstrom. The fractal properties of the AFM data acquired indicate that the growth process of the substrate SiO structures is governed by a diffusion law. It is reasonable to expect a decrease of the surface order parameter for the interface layer of a liquid crystal close to this kind of substrate.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
