We observe with an atomic force microscope (AFM) the surface of a rough substrate that gives bistable anchoring for typical nematic liquid crystals. This surface is obtained by oblique evaporation of a thin film of SiO (average thickness approximately 150 angstrom) on a smooth glass plate. It appears highly disordered and exhibits very small structures with a typical horizontal size of 500 angstrom and a typical vertical size of 200 angstrom. The fractal properties of the AFM data acquired indicate that the growth process of the substrate SiO structures is governed by a diffusion law. It is reasonable to expect a decrease of the surface order parameter for the interface layer of a liquid crystal close to this kind of substrate.

AFM EXPERIMENTAL-OBSERVATION AND FRACTAL CHARACTERIZATION OF AN SIO-COATED PLATE FOR NEMATIC BISTABLE ANCHORING

BARBERI, Riccardo Cristoforo;
1994-01-01

Abstract

We observe with an atomic force microscope (AFM) the surface of a rough substrate that gives bistable anchoring for typical nematic liquid crystals. This surface is obtained by oblique evaporation of a thin film of SiO (average thickness approximately 150 angstrom) on a smooth glass plate. It appears highly disordered and exhibits very small structures with a typical horizontal size of 500 angstrom and a typical vertical size of 200 angstrom. The fractal properties of the AFM data acquired indicate that the growth process of the substrate SiO structures is governed by a diffusion law. It is reasonable to expect a decrease of the surface order parameter for the interface layer of a liquid crystal close to this kind of substrate.
Liquid Crystals; Atomic Force Microscopy; Anchoring
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.11770/163807
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