Microwave imaging techniques aim at inspecting targets by using interrogating microwaves. In recent years, several numerical inversion methods and prototypes of microwave imaging systems have been developed. In most cases, they consider an illuminating apparatus and one or more probes used to measure the field scattered by the target; usually, the values of the amplitudes and phases of the field samples are needed. In this work, a hybrid approach for phaseless imaging of dielectric targets is proposed. A two-probe measurement strategy with the related phase-retrieval method is adopted in conjunction with an inversion procedure based on an inexact-Newton method to give an efficient and low-cost imaging setup. Preliminary numerical and experimental validations are discussed.

An inverse scattering approach for inspecting dielectric scatterers at microwave frequencies without phase information

COSTANZO, Sandra;DI MASSA, Giuseppe;
2013-01-01

Abstract

Microwave imaging techniques aim at inspecting targets by using interrogating microwaves. In recent years, several numerical inversion methods and prototypes of microwave imaging systems have been developed. In most cases, they consider an illuminating apparatus and one or more probes used to measure the field scattered by the target; usually, the values of the amplitudes and phases of the field samples are needed. In this work, a hybrid approach for phaseless imaging of dielectric targets is proposed. A two-probe measurement strategy with the related phase-retrieval method is adopted in conjunction with an inversion procedure based on an inexact-Newton method to give an efficient and low-cost imaging setup. Preliminary numerical and experimental validations are discussed.
2013
microwave imaging; phaseless
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.11770/170950
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo

Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 3
  • ???jsp.display-item.citation.isi??? 1
social impact