This paper points out to the use of a COTS SAFe-FET in the design of an Embedded mini-Heater (EmH) addressed for Accelerated Life Tests (ALTs) on power semiconductor devices. EmH is designed to detect and control the thermal runaway on a device under test (DUT) while thermal and electrical stress are applied. The heating and sensing temperature processes are controlled by discrete PID algorithms running on a microcontroller. As results, EmH can reach a DUT heating temperature of 175°C with a temperature resolution of 0.5°C using a maximum heating power of 10.6W. Even more, due to the small size and low heating power consumption of EmH, loss power dissipation from a single DUT can be measured remotely without any electrical interface connection to detect its degradation during an ALT avoiding to interrupt the electric stress.
Embedded mini-Heater Design for Power Loss Remote Measurement and Thermal Runaway Control on Power Devices for Accelerated Life Testing
PACE, Calogero
2016-01-01
Abstract
This paper points out to the use of a COTS SAFe-FET in the design of an Embedded mini-Heater (EmH) addressed for Accelerated Life Tests (ALTs) on power semiconductor devices. EmH is designed to detect and control the thermal runaway on a device under test (DUT) while thermal and electrical stress are applied. The heating and sensing temperature processes are controlled by discrete PID algorithms running on a microcontroller. As results, EmH can reach a DUT heating temperature of 175°C with a temperature resolution of 0.5°C using a maximum heating power of 10.6W. Even more, due to the small size and low heating power consumption of EmH, loss power dissipation from a single DUT can be measured remotely without any electrical interface connection to detect its degradation during an ALT avoiding to interrupt the electric stress.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.