We have implemented an apertureless Scanning Near-Field Optical Microscope (SNOM) setup on a commercial Atomic Force Microscope (AFM), using a suitable optical apparatus and preserving AFM performances. This approach is promising for extending SNOM analysis to delicate samples, such as liquid or polymer films. Preliminary measurements on glass-metal nanometric steps show a lateral resolution better than 10 nm both in topography and in optical signal.

Apertureless SNOM microscopy on a commercial AFM

BARBERI, Riccardo Cristoforo;
2001-01-01

Abstract

We have implemented an apertureless Scanning Near-Field Optical Microscope (SNOM) setup on a commercial Atomic Force Microscope (AFM), using a suitable optical apparatus and preserving AFM performances. This approach is promising for extending SNOM analysis to delicate samples, such as liquid or polymer films. Preliminary measurements on glass-metal nanometric steps show a lateral resolution better than 10 nm both in topography and in optical signal.
SCANNING OPTICAL MICROSCOPY; Atomic Force Microscopy
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.11770/186519
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