A low cost Software Defined Measurement system is proposed in this work to implement a multipurpose dielectric characterization procedure able to work under various materials conditions. Two different retrieving algorithms are discussed as application examples in the presence of single and multilayer dielectric structures, and the relative permittivity reconstructions versus frequency are reported.
Multipurpose software defined measurement system for dielectric characterization
COSTANZO, Sandra;DI MASSA, Giuseppe;
2014-01-01
Abstract
A low cost Software Defined Measurement system is proposed in this work to implement a multipurpose dielectric characterization procedure able to work under various materials conditions. Two different retrieving algorithms are discussed as application examples in the presence of single and multilayer dielectric structures, and the relative permittivity reconstructions versus frequency are reported.File in questo prodotto:
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