An integrated probe for phaseless near-field measurements

A novel approach for phaseless near-field measurements is presented. The squared amplitudes received by two co-planarprobes simultaneously scanning a near-field planar surface are used to retrieve the near-field phase information andsubsequently to perform the near-field / far-field transformation. The approach is advantageous with respect to bothmicrowave holography and existing phase retrieval techniques, since it does not require any increase in the cost of themeasurement facility or in the scan time, so conventional low-cost near-field equipments can be used. The effectiveness ofthe technique is shown by reporting experimental validations on measurements of a microstrip patch antenna for SARapplications.