Natural diamond (001) and (111) surfaces as well as highly oriented pyrolithic graphite (HOPG) (0001) have been analyzed by X-ray induced photoelectron diffraction (XPD). The measured 2pi patterns of C 1s emission (964 and 1450 eV) and of KVV Auger emission (260 eV) are compared to single scattering cluster (SCC) calculations, and excellent agreement is found. The comparisons show that photoelectron forward focusing is much less prominent in carbon solids than in all previously studied, heavier elements, and a direct interpretation of the data is therefore more difficult. The highly textured nature of HOPG presents itself as a circular pattern with concentric rings centered at the surface normal (c-axis). The aim of this work is to show the advantage of the XPD technique as a diagnostic tool for the investigation of epitaxial diamond growth with monolayer sensitivity.
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|Titolo:||X-RAY PHOTOELECTRON AND AUGER-ELECTRON DIFFRACTION STUDY OF DIAMOND AND GRAPHITE SURFACES|
|Data di pubblicazione:||1994|
|Appare nelle tipologie:||1.1 Articolo in rivista|