X-ray photoelectron diffraction (XPD), a newly established technique in surface science, was used to investigate the diamond (111) surface as well as the growth of Cu on this surface. Measurements are presented along with single-scattering-cluster calculations. From these measurements it is clearly seen that Cu grows epitaxially on top of the diamond (111) surface. XPD proves to be an adequate diagnostic technique to study diamond surfaces and growth processes.
Photoelectron diffraction analysis of diamond and metal-diamond interfaces
AGOSTINO, Raffaele Giuseppe
1993-01-01
Abstract
X-ray photoelectron diffraction (XPD), a newly established technique in surface science, was used to investigate the diamond (111) surface as well as the growth of Cu on this surface. Measurements are presented along with single-scattering-cluster calculations. From these measurements it is clearly seen that Cu grows epitaxially on top of the diamond (111) surface. XPD proves to be an adequate diagnostic technique to study diamond surfaces and growth processes.File in questo prodotto:
Non ci sono file associati a questo prodotto.
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.
