X-ray photoelectron diffraction (XPD), a newly established technique in surface science, was used to investigate the diamond (111) surface as well as the growth of Cu on this surface. Measurements are presented along with single-scattering-cluster calculations. From these measurements it is clearly seen that Cu grows epitaxially on top of the diamond (111) surface. XPD proves to be an adequate diagnostic technique to study diamond surfaces and growth processes.

Photoelectron diffraction analysis of diamond and metal-diamond interfaces

AGOSTINO, Raffaele Giuseppe
1993

Abstract

X-ray photoelectron diffraction (XPD), a newly established technique in surface science, was used to investigate the diamond (111) surface as well as the growth of Cu on this surface. Measurements are presented along with single-scattering-cluster calculations. From these measurements it is clearly seen that Cu grows epitaxially on top of the diamond (111) surface. XPD proves to be an adequate diagnostic technique to study diamond surfaces and growth processes.
SURFACE ; DEPOSITION
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/20.500.11770/148972
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