We present the first full experimental characterization of a single-qubit device. This method uses a Pauli Process Tomography at the output of the device and needs only a single entangled state at the input, which works as all possible input states in quantum parallel. The method can be easily extended to any n-qubits processing device.
Pauli tomography: complete characterization of a single qubit device
RICCI, MARCO;
2003-01-01
Abstract
We present the first full experimental characterization of a single-qubit device. This method uses a Pauli Process Tomography at the output of the device and needs only a single entangled state at the input, which works as all possible input states in quantum parallel. The method can be easily extended to any n-qubits processing device.File in questo prodotto:
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