We present the first full experimental characterization of a single-qubit device. This method uses a Pauli Process Tomography at the output of the device and needs only a single entangled state at the input, which works as all possible input states in quantum parallel. The method can be easily extended to any n-qubits processing device.
Pauli tomography: complete characterization of a single qubit device / A., Mazzei; Ricci, Marco; F., DE MARTINI; G. M., D'Ariano. - In: FORTSCHRITTE DER PHYSIK. - ISSN 0015-8208. - 51, 342(2003).
Scheda prodotto non validato
Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo
Titolo: | Pauli tomography: complete characterization of a single qubit device |
Autori: | |
Data di pubblicazione: | 2003 |
Rivista: | |
Citazione: | Pauli tomography: complete characterization of a single qubit device / A., Mazzei; Ricci, Marco; F., DE MARTINI; G. M., D'Ariano. - In: FORTSCHRITTE DER PHYSIK. - ISSN 0015-8208. - 51, 342(2003). |
Abstract: | We present the first full experimental characterization of a single-qubit device. This method uses a Pauli Process Tomography at the output of the device and needs only a single entangled state at the input, which works as all possible input states in quantum parallel. The method can be easily extended to any n-qubits processing device. |
Handle: | http://hdl.handle.net/20.500.11770/149504 |
Appare nelle tipologie: | 1.1 Articolo in rivista |