Repeater insertion is one of the most effective techniques to reduce the propagation delay related to long interconnects. However, its application to deep submicron technologies leads to sub-optimal results if the traditional sizing rules are followed. In the paper the Authors show the behaviour of deep-sub micron devices may differ significantly from the conventional one due to transistor parasitic capacitance. As a consequence, well-exploited assumption as linear relationship between channel width and output conductance of the CMOS gate start to fails, as well as it does optimisation techniques based upon them. A developed formula for buffer sizing is proposed based on a simplified model allowing MOS parasitic to be taken into account. Up to 50% area and leakage power saving can be obtained.
A Simple MOSFET Parasitic Capacitance Model and Its Application to Repeater Insertion Technique
CAPPUCCINO, Gregorio;Cocorullo G.
2006-01-01
Abstract
Repeater insertion is one of the most effective techniques to reduce the propagation delay related to long interconnects. However, its application to deep submicron technologies leads to sub-optimal results if the traditional sizing rules are followed. In the paper the Authors show the behaviour of deep-sub micron devices may differ significantly from the conventional one due to transistor parasitic capacitance. As a consequence, well-exploited assumption as linear relationship between channel width and output conductance of the CMOS gate start to fails, as well as it does optimisation techniques based upon them. A developed formula for buffer sizing is proposed based on a simplified model allowing MOS parasitic to be taken into account. Up to 50% area and leakage power saving can be obtained.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.