Perfect light absorption in the visible and near-infrared (NIR) was demonstrated using metamaterials, plasmonic nanostructures, and thin films. Thin film absorbers offer a simple and low-cost design as they can be produced on large areas and without lithography. Light is strongly absorbed in thin film metal-dielectric-metal (MDM) cavities at their resonance frequencies. However, a major drawback of MDM absorbers is their strong resonance iridescence, i.e., angle dependence. Here, we solve the iridescence problem by achieving angle-insensitive narrowband perfect and near-perfect light absorption. In particular, we show analytically that using a high-index dielectric in MDM cavities is sufficient to achieve angle-insensitive cavity resonance. We demonstrate experimentally angle-insensitive perfect and near-perfect absorbers in the NIR and visible regimes up to ±60°. By overcoming the iridescence problem, we open the door for practical applications of MDM absorbers at optical frequencies.
Iridescence-free and narrowband perfect light absorption in critically coupled metal high-index dielectric cavities / Elkabbash, M.; Ilker, E.; Letsou, T.; Hoffman, N.; Yaney, A.; Hinczewski, M.; Strangi, G.. - In: OPTICS LETTERS. - ISSN 0146-9592. - 42:18(2017), pp. 3598-3601.
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Titolo: | Iridescence-free and narrowband perfect light absorption in critically coupled metal high-index dielectric cavities |
Autori: | |
Data di pubblicazione: | 2017 |
Rivista: | |
Citazione: | Iridescence-free and narrowband perfect light absorption in critically coupled metal high-index dielectric cavities / Elkabbash, M.; Ilker, E.; Letsou, T.; Hoffman, N.; Yaney, A.; Hinczewski, M.; Strangi, G.. - In: OPTICS LETTERS. - ISSN 0146-9592. - 42:18(2017), pp. 3598-3601. |
Handle: | http://hdl.handle.net/20.500.11770/278430 |
Appare nelle tipologie: | 1.1 Articolo in rivista |