Cylindrical vector beams are used to improve back scattering detection in photonic force microscopy measurements near a dielectric surface. We compare back focal plane interferometry signals acquired on a quadrant photodiode when optical trapping a latex microparticle with gaussian, radial, and azimuthal beams. We find a consistent reduction of the interference pattern generated by the superposition of light backscattered by the trapped particle and backreflected by the dielectric surface. We contrast experimental findings with a model based on light scattering theory in the T - matrix formalism.

Improved backscattering detection in photonic force microscopy near dielectric surfaces with cylindrical vector beams

Patti F.;Saija R.;Strangi G.;
2021

Abstract

Cylindrical vector beams are used to improve back scattering detection in photonic force microscopy measurements near a dielectric surface. We compare back focal plane interferometry signals acquired on a quadrant photodiode when optical trapping a latex microparticle with gaussian, radial, and azimuthal beams. We find a consistent reduction of the interference pattern generated by the superposition of light backscattered by the trapped particle and backreflected by the dielectric surface. We contrast experimental findings with a model based on light scattering theory in the T - matrix formalism.
Back - focal plane interferometry
Cylindrical vector beams
Optical tweezers
T - matrix
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.11770/311725
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