Sfoglia per Rivista
Theory and experiment of suppressed shot noise in stress-induced leakage currents
2003-01-01 Iannaccone, G; Crupi, Felice; Neri, B; Lombardo, S.
Threshold Voltage Variability of NROM memories after exposure to ionizing radiation
2012-01-01 Corso, D; Libertino, S; Lisiansky, M; Roizin, Y; Palumbo, F; Principato, F; Pace, Calogero; Finocchiaro, P; Lombardo, S.
Understanding and Optimization of Hot-Carrier Reliability in Germanium-on-Silicon pMOSFETs
2009-01-01 Maji, D; Crupi, Felice; Amat, E; Simoen, E; De Jaeger, B; Brunco, Dp; Manoj, Cr; Rao, Vr; Magnone, P; Giusi, G; Pace, Calogero; Pantisano, L; Mitard, J; Rodriguez, R; Nafria, M.
Understanding the Potential and Limitations of Tunnel FETs for Low-Voltage Analog/Mixed-Signal Circuits
2017-01-01 Settino, F; Lanuzza, Marco; Strangio, S; Crupi, Felice; Palestri, P; Esseni, D; Selmi, L.
Titolo | Data di pubblicazione | Autore(i) | File |
---|---|---|---|
Theory and experiment of suppressed shot noise in stress-induced leakage currents | 1-gen-2003 | Iannaccone, G; Crupi, Felice; Neri, B; Lombardo, S. | |
Threshold Voltage Variability of NROM memories after exposure to ionizing radiation | 1-gen-2012 | Corso, D; Libertino, S; Lisiansky, M; Roizin, Y; Palumbo, F; Principato, F; Pace, Calogero; Finocchiaro, P; Lombardo, S. | |
Understanding and Optimization of Hot-Carrier Reliability in Germanium-on-Silicon pMOSFETs | 1-gen-2009 | Maji, D; Crupi, Felice; Amat, E; Simoen, E; De Jaeger, B; Brunco, Dp; Manoj, Cr; Rao, Vr; Magnone, P; Giusi, G; Pace, Calogero; Pantisano, L; Mitard, J; Rodriguez, R; Nafria, M. | |
Understanding the Potential and Limitations of Tunnel FETs for Low-Voltage Analog/Mixed-Signal Circuits | 1-gen-2017 | Settino, F; Lanuzza, Marco; Strangio, S; Crupi, Felice; Palestri, P; Esseni, D; Selmi, L. |
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