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A wide range past monochromator for the SEXAFS and X-ray Standing Waves beamline at ESRF 1-gen-1997 Comin, L; Ortega, L; Caihol, V; Formoso, Vincenzo; DE MARTINO, R; Fezzaa, K.
Trace element analysis on Si wafer surfaces by TXRF at the ID32 ESRF undulator beamline 1-gen-1998 Ortega, L; Comin, F; Formoso, Vincenzo; Stierle, A.
High-energy resonant photoemission and resonant Auger spectroscopy in Ce-Rh compounds 1-gen-1998 Le Fèvre, P; Magnan, H; Chandesris, D; Vogel, J; Formoso, Vincenzo; Comin, F.
Combined high resolution X-ray diffraction and EXAFS studies of Si(1-x)Ge-x heterostructures 1-gen-1998 De Padova, P; Felici, R; Larciprete, R; Ferrari, L; Ortega, L; Formoso, Vincenzo; Comin, F; Balerna, A.
Characterization And Properties Of The AIPdMn 5 Surface 1-gen-1998 G., Cappello; A., Dechelette; F., Schmithusen; J., Chevrier; F., Comin; A., Stierle; Formoso, Vincenzo; M., De Boissieu; T., Lograsso; C., Jenks; D., Delaney
High energy resonant photoemission and resonant Auger spectroscopy in mixed valent Ce compounds 1-gen-1999 P., LE FEVRE; H., Magnan; J., Vogel; Formoso, Vincenzo; K., Hricovini; D., Chandesris
Porous silicon strain during in situ ultrahigh vacuum thermal annealing 1-gen-1999 D., Buttard; G., Dolino; C., Faivre; A., Halimaoui; F., Comin; Formoso, Vincenzo; L., Ortega
L-3 and M-4,M-5 absorption edges of intermediate valent cerium unravelled by resonant photoemission and resonant Auger spectroscopy 1-gen-1999 Le Fevre, P; Magnan, H; Vogel, J; Formoso, Vincenzo; Hricovini, K; Chandesris, D.
Chemical-shift X-ray standing wave studies: coadsorption site determination of PFx fragments on Ni(111) 1-gen-1999 G. J., Jackson; J., Ludecke; D. P., Woodruff; A. S. Y., Chan; N. K., Singh; J., Mccombie; R. G., Jones; B. C. C., Cowie; Formoso, Vincenzo
A study on background subtraction in Auger and photoelectron time coincidence spectroscopy using third generation synchrotron radiation source 1-gen-1999 P., Calicchia; S., Lagomarsino; F., Scarinci; C., Martinelli; Formoso, Vincenzo
Ce electronic structure studied by resonant electron spectroscopies 1-gen-1999 Le Fevre, P; Magnan, H; Hricovini, K; Chandesris, D; Vogel, J; Formoso, Vincenzo; Eickhoff, T; Drube, W.
Surface-plasmon dispersion and multipole surface plasmons in Al(111) 1-gen-2000 Chiarello, G; Formoso, Vincenzo; Santaniello, A; Colavita, E; Papagno, L.
Surface X-ray diffraction study on the initial oxidation of NiAl(100) 1-gen-2000 A., STIERLE A; Formoso, Vincenzo; F., Comin; R., Franchy
Oxidation of NiAl(1 0 0) studied with surface sensitive X-ray diffraction 1-gen-2000 A., Stierle; Formoso, Vincenzo; F., Comin; G., Schmitz; R., Franchy
Bulk and surface evidence for the long-range spatial modulation of X-ray absorption in the Al–Pd–Mn quasicrystal at Bragg incidence 1-gen-2000 G., Cappello; A., Dechelette; F., Schmithsen; S., Decossas; J., Chevrier; F., Comin; Formoso, Vincenzo; M., DE BOISSIEU; T., Jach; R., Colella; T. A., Lograsso; C., Jenks; D., Delaney
Characterization of surface morphologies at the Al–Pd–Mn fivefold surface 1-gen-2000 G., Cappello; F., Schmithsen; J., Chevrier; F., Comin; A., Stierle; Formoso, Vincenzo; M., DE BOISSIEU; M., Boudard; T. A., Lograsso; C., Jenks; D., Delaney
1s shake-up excitations in Ge and GeO2 by high energy x-ray photoemission spectroscopy 1-gen-2000 Formoso, Vincenzo; Filipponi, A.; DI CICCO, A.; Chiarello, Gennaro; Felici, R.; Santaniello, A.
A structural study of the interaction of SO2 with Cu(111) 1-gen-2000 G. J., Jackson; S. M., Driver; D. P., Woodruff; N., Abrams; R. G., Jones; M. T., Butterfield; M. D., Crapper; B. C. C., Cowie; Formoso, Vincenzo
Chemical-Shift Normal Incidence X-Ray Standing Wave Determination of Adsorbate Structures 1-gen-2000 Formoso, Vincenzo
Following Local Adsorption Sites through a Surface Chemical Reaction: CH3SH on Cu(111) 1-gen-2000 G. J., Jackson; D. P., Woodruff; R. G., Jones; N. K., Singh; A. S. Y., Chan; B. C. C., Cowie; Formoso, Vincenzo
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