TROJMAN, LIONEL

TROJMAN, LIONEL  

Dipartimento di Ingegneria Informatica, Modellistica, Elettronica e Sistemistica  

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Assessment of STT-MRAM performance at nanoscaled technology nodes using a device-to-memory simulation framework 1-gen-2019 Garzon, E.; De Rose, R.; Crupi, F.; Trojman, L.; Lanuzza, M.
Influence of GaN- and Si 3 N 4 -Passivation layers on the performance of AlGaN/GaN diodes with a gated edge termination 1-gen-2019 Acurio, Eliana; Crupi, Felice; Ronchi, Nicolo; De Jaeger, Brice; Bakeroot, Benoit; Decoutere, Stefaan; Trojman, Lionel
Low-Cost Smart Living Environment Monitoring Systems from a Metrological Point of View 1-gen-2022 Jimenez, J. -J.; Carni, D. L.; Trojman, L.; Procel, L. -M.; Lamonaca, F.
Reliability improvements in AlGaN/GaN schottky barrier diodes with a gated edge termination 1-gen-2018 ACURIO MENDEZ, ELIANA MARIBEL; Crupi, Felice; Ronchi, Nicolo; De Jaeger, Brice; Bakeroot, Benoit; Decoutere, Stefaan; Trojman, Lionel
Reliability in GaN-based devices for power applications 1-gen-2018 Acurio, Eliana; Trojman, Lionel; Crupi, Felice; Iucolano, Ferdinando; Ronchi, Nicolo; De Jaeger, Brice; Bakeroot, Benoit; Decoutere, Stefaan