TROJMAN, LIONEL
TROJMAN, LIONEL
Dipartimento di Ingegneria Informatica, Modellistica, Elettronica e Sistemistica
Assessment of STT-MRAM performance at nanoscaled technology nodes using a device-to-memory simulation framework
2019-01-01 Garzon, E.; De Rose, R.; Crupi, F.; Trojman, L.; Lanuzza, M.
Influence of GaN- and Si 3 N 4 -Passivation layers on the performance of AlGaN/GaN diodes with a gated edge termination
2019-01-01 Acurio, Eliana; Crupi, Felice; Ronchi, Nicolo; De Jaeger, Brice; Bakeroot, Benoit; Decoutere, Stefaan; Trojman, Lionel
Low-Cost Smart Living Environment Monitoring Systems from a Metrological Point of View
2022-01-01 Jimenez, J. -J.; Carni, D. L.; Trojman, L.; Procel, L. -M.; Lamonaca, F.
Reliability improvements in AlGaN/GaN schottky barrier diodes with a gated edge termination
2018-01-01 ACURIO MENDEZ, ELIANA MARIBEL; Crupi, Felice; Ronchi, Nicolo; De Jaeger, Brice; Bakeroot, Benoit; Decoutere, Stefaan; Trojman, Lionel
Reliability in GaN-based devices for power applications
2018-01-01 Acurio, Eliana; Trojman, Lionel; Crupi, Felice; Iucolano, Ferdinando; Ronchi, Nicolo; De Jaeger, Brice; Bakeroot, Benoit; Decoutere, Stefaan
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| Assessment of STT-MRAM performance at nanoscaled technology nodes using a device-to-memory simulation framework | 1-gen-2019 | Garzon, E.; De Rose, R.; Crupi, F.; Trojman, L.; Lanuzza, M. | |
| Influence of GaN- and Si 3 N 4 -Passivation layers on the performance of AlGaN/GaN diodes with a gated edge termination | 1-gen-2019 | Acurio, Eliana; Crupi, Felice; Ronchi, Nicolo; De Jaeger, Brice; Bakeroot, Benoit; Decoutere, Stefaan; Trojman, Lionel | |
| Low-Cost Smart Living Environment Monitoring Systems from a Metrological Point of View | 1-gen-2022 | Jimenez, J. -J.; Carni, D. L.; Trojman, L.; Procel, L. -M.; Lamonaca, F. | |
| Reliability improvements in AlGaN/GaN schottky barrier diodes with a gated edge termination | 1-gen-2018 | ACURIO MENDEZ, ELIANA MARIBEL; Crupi, Felice; Ronchi, Nicolo; De Jaeger, Brice; Bakeroot, Benoit; Decoutere, Stefaan; Trojman, Lionel | |
| Reliability in GaN-based devices for power applications | 1-gen-2018 | Acurio, Eliana; Trojman, Lionel; Crupi, Felice; Iucolano, Ferdinando; Ronchi, Nicolo; De Jaeger, Brice; Bakeroot, Benoit; Decoutere, Stefaan |