This article describes a method for voltage noise measurements with a sensitivity superior to that of conventional methods. This is obtained by resorting to an original three-channel amplifier configuration and by following a four-step measurement procedure. A comparative analysis of this method and the conventional cross-correlation technique is presented. SPICE simulations and noise measurements performed on a prototype circuit demonstrate the validity of the proposed approach.

This article describes a method for voltage noise measurements with a sensitivity superior to that of conventional methods. This is obtained by resorting to an original three-channel amplifier configuration and by following a four-step measurement procedure. A comparative analysis of this method and the conventional cross-correlation technique is presented. SPICE simulations and noise measurements performed on a prototype circuit demonstrate the validity of the proposed approach. (c) 2006 American Institute of Physics.

Three-channel amplifier for high-sensitivity voltage noise measurements

CRUPI, Felice;PACE, Calogero
2006-01-01

Abstract

This article describes a method for voltage noise measurements with a sensitivity superior to that of conventional methods. This is obtained by resorting to an original three-channel amplifier configuration and by following a four-step measurement procedure. A comparative analysis of this method and the conventional cross-correlation technique is presented. SPICE simulations and noise measurements performed on a prototype circuit demonstrate the validity of the proposed approach.
2006
This article describes a method for voltage noise measurements with a sensitivity superior to that of conventional methods. This is obtained by resorting to an original three-channel amplifier configuration and by following a four-step measurement procedure. A comparative analysis of this method and the conventional cross-correlation technique is presented. SPICE simulations and noise measurements performed on a prototype circuit demonstrate the validity of the proposed approach. (c) 2006 American Institute of Physics.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.11770/140683
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