The power spectral densities of the current fluctuations through fresh and stressed thin oxide are investigated by means of a purposely designed ultra low noise measurement system. It is reported for the first time that the SILC noise spectrum exhibits partially suppressed shot noise down to about 70% with respect to the full shot noise observed for fresh oxide in Fowler-Nordheim regime. II is shown that a single trap assisted tunneling model with a uniform trap distribution in both energy and space is able to justify the observed noise behavior. (C) 2000 Elsevier Science Ltd. All rights reserved.

Short noise partial suppression in the SILC regime

CRUPI, Felice;
2000

Abstract

The power spectral densities of the current fluctuations through fresh and stressed thin oxide are investigated by means of a purposely designed ultra low noise measurement system. It is reported for the first time that the SILC noise spectrum exhibits partially suppressed shot noise down to about 70% with respect to the full shot noise observed for fresh oxide in Fowler-Nordheim regime. II is shown that a single trap assisted tunneling model with a uniform trap distribution in both energy and space is able to justify the observed noise behavior. (C) 2000 Elsevier Science Ltd. All rights reserved.
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/20.500.11770/157908
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