This demo demonstrates the unique capabilities of the multimode Dual Mode Logic (DML) design technique to define run-time adaptive datapaths to overcome process and environmental (i.e., temperature and voltage) variations. A proof-of concept benchmark circuit is designed and fabricated in 65 nm technology. Measurements on 10 test chips, while considering supply voltages spanning 0.6V to 1.2V and temperature variations ranging from − 40 ° C to 125 ° C confirmed the effectiveness of the proposed approach to compensate even for severe process, voltage and temperature (PVT) variations.

Live Demo: Silicon evaluation of multimode dual mode logic for PVT-aware datapaths

Taco R.;Lanuzza M.;
2021-01-01

Abstract

This demo demonstrates the unique capabilities of the multimode Dual Mode Logic (DML) design technique to define run-time adaptive datapaths to overcome process and environmental (i.e., temperature and voltage) variations. A proof-of concept benchmark circuit is designed and fabricated in 65 nm technology. Measurements on 10 test chips, while considering supply voltages spanning 0.6V to 1.2V and temperature variations ranging from − 40 ° C to 125 ° C confirmed the effectiveness of the proposed approach to compensate even for severe process, voltage and temperature (PVT) variations.
2021
978-1-7281-9201-7
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.11770/323187
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