Sfoglia per Rivista IEEE TRANSACTIONS ON ELECTRON DEVICES
Reliability comparison of triple-gate versus planar SOIFETs
2006-01-01 Crupi, Felice; Kaczer, B; Degraeve, R; Subramanian, V; Srinivasan, P; Simoen, E; Dixit, A; Jurczak, M; Groeseneken, G.
Reliability improvements in AlGaN/GaN schottky barrier diodes with a gated edge termination
2018-01-01 ACURIO MENDEZ, ELIANA MARIBEL; Crupi, Felice; Ronchi, Nicolo; De Jaeger, Brice; Bakeroot, Benoit; Decoutere, Stefaan; Trojman, Lionel
Theory and experiment of suppressed shot noise in stress-induced leakage currents
2003-01-01 Iannaccone, G; Crupi, Felice; Neri, B; Lombardo, S.
Threshold Voltage Variability of NROM memories after exposure to ionizing radiation
2012-01-01 Corso, D; Libertino, S; Lisiansky, M; Roizin, Y; Palumbo, F; Principato, F; Pace, Calogero; Finocchiaro, P; Lombardo, S.
Understanding and Optimization of Hot-Carrier Reliability in Germanium-on-Silicon pMOSFETs
2009-01-01 Maji, D; Crupi, Felice; Amat, E; Simoen, E; De Jaeger, B; Brunco, Dp; Manoj, Cr; Rao, Vr; Magnone, P; Giusi, G; Pace, Calogero; Pantisano, L; Mitard, J; Rodriguez, R; Nafria, M.
Understanding the Potential and Limitations of Tunnel FETs for Low-Voltage Analog/Mixed-Signal Circuits
2017-01-01 Settino, F; Lanuzza, Marco; Strangio, S; Crupi, Felice; Palestri, P; Esseni, D; Selmi, L.
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| Reliability comparison of triple-gate versus planar SOIFETs | 1-gen-2006 | Crupi, Felice; Kaczer, B; Degraeve, R; Subramanian, V; Srinivasan, P; Simoen, E; Dixit, A; Jurczak, M; Groeseneken, G. | |
| Reliability improvements in AlGaN/GaN schottky barrier diodes with a gated edge termination | 1-gen-2018 | ACURIO MENDEZ, ELIANA MARIBEL; Crupi, Felice; Ronchi, Nicolo; De Jaeger, Brice; Bakeroot, Benoit; Decoutere, Stefaan; Trojman, Lionel | |
| Theory and experiment of suppressed shot noise in stress-induced leakage currents | 1-gen-2003 | Iannaccone, G; Crupi, Felice; Neri, B; Lombardo, S. | |
| Threshold Voltage Variability of NROM memories after exposure to ionizing radiation | 1-gen-2012 | Corso, D; Libertino, S; Lisiansky, M; Roizin, Y; Palumbo, F; Principato, F; Pace, Calogero; Finocchiaro, P; Lombardo, S. | |
| Understanding and Optimization of Hot-Carrier Reliability in Germanium-on-Silicon pMOSFETs | 1-gen-2009 | Maji, D; Crupi, Felice; Amat, E; Simoen, E; De Jaeger, B; Brunco, Dp; Manoj, Cr; Rao, Vr; Magnone, P; Giusi, G; Pace, Calogero; Pantisano, L; Mitard, J; Rodriguez, R; Nafria, M. | |
| Understanding the Potential and Limitations of Tunnel FETs for Low-Voltage Analog/Mixed-Signal Circuits | 1-gen-2017 | Settino, F; Lanuzza, Marco; Strangio, S; Crupi, Felice; Palestri, P; Esseni, D; Selmi, L. |
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