Sfoglia per Autore
The integral approach to the sputtering
1993-01-01 Falcone, Giovanni; Aiello, D.; Forlano, L; Piperno, F.
Ion emission from an electronically perturbed solid surface
1994-01-01 Sroubek, Z; Falcone, Giovanni; Aiello, D; Attanasio, C.
Contribution of different generations of recoils to sputtering by backscattering light ions
1994-01-01 Aaiello, D.; Pletnev, V.; Falcone, Giovanni; Forlano, L.
Energy distribution of reflected ions at normal incidence on the target surface
1996-01-01 Forlano, L.; Falcone, Giovanni; A. I., Tolmachev
Kinematics of sputtered excited atoms
1996-01-01 Falcone, Giovanni; Piperno, F.
Generalized Lindhard power cross section
1997-01-01 Falcone, Giovanni; Piperno, F.
Energy distribution of reflected ions at normal incidence on the target surface
1997-01-01 Tolmachev, A. I.; Falcone, Giovanni; Forlano, L.
The restitution coefficient: a new interpretation
1998-01-01 Falcone, Giovanni; Piperno, F.
Ion emission from an electronically perturbed solid surface: a generalized formulation
1998-01-01 Falcone, Giovanni; Sindona, A.
Angular distribution of reflected particles at medium-energy ion incident on solid surfaces
1998-01-01 Falcone, Giovanni; Forlano, L.; Mashkova, E. S.; Molchanov, V. A.; Tolmachev, A. I.
Angular distribution of particles, reflected from a solid surface: theory and experiment
1998-01-01 Mashkova, E. S.; Molchanov, V. A.; Tolmachev, A. I.; Falcone, Giovanni; Forlano, L.
Ion emission from an electronically perturbed solid surface: A general formulation
1998-01-01 Falcone, Giovanni; Sindona, Antonio
Energy distribution of light ion backscattered from a solid
1999-01-01 Falcone, Giovanni; Forlano, L; Tolmachev, A.
Deep level promotion mechanism in sputtering
1999-01-01 Sindona, Antonio; Falcone, Giovanni
Surface influences on resonant ionization during sputtering
1999-01-01 Sindona, Antonio; Falcone, Giovanni
Spatial Distribution of particles sputtered under Ion Bombardment.II. Oblique incidence
2000-01-01 Mashkova, E; Molchanov, ; Falcone, Giovanni
Spatial distribution of the particles sputtered under ion bombardment. III Oblique incidence
2001-01-01 Mashkova, E. S.; Molchanov, V. A.; Falcone, Giovanni
Evidences of a double resonant ionization mechanism in sputtering of metals
2003-01-01 Sindona, Antonio; Falcone, Giovanni
Broadening effects in Auger neutralization of 130-430eV Ar ions at Al surfaces
2005-01-01 Sindona, Antonio; Baragiola, R. A; Falcone, Giovanni; Oliva, A; Riccardi, Pierfrancesco
Many Body Shake-up in Auger Neutralization of Slow Ar+ Ions at Al Surfaces
2005-01-01 Sindona, Antonio; Baragiola, R.; Falcone, Giovanni; Oliva, A.; Riccardi, Pierfrancesco
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