Energy consumption is one of the main barriers to current high-performance designs. Moreover, the increased variability experienced in advanced process technologiesimplies further timing yield concerns and therefore intensifies this obstacle. Thus, proper techniques to achieve robust designs are a critical requirement for integrated circuit success. In this paper, the influence of intra-die random process variations is analyzedconsidering the particular case of the design of energy aware adder circuits. Five well known adder circuits were designed exploiting an industrial 45 nm static complementary metal-oxide semiconductor (CMOS) standard cell library. The designed adders were comparatively evaluated under different energy constraints. As a main result, the performed analysis demonstrates that, for a given energy budget, simpler circuits (whichare conventionally identified as low-energy slow architectures) operating at higher power supply voltages can achieve a timing yield significantly better than more complex faster adders when used in low-power design with supply voltages lower than nominal.
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|Titolo:||Design of Energy Aware Adder Circuits Considering Random Intra-Die Process Variations|
LANUZZA, Marco (Corresponding)
|Data di pubblicazione:||2011|
|Citazione:||Design of Energy Aware Adder Circuits Considering Random Intra-Die Process Variations / Lanuzza, Marco; Frustaci, F; Perri, Stefania; Corsonello, Pasquale. - In: JOURNAL OF LOW POWER ELECTRONICS AND APPLICATIONS. - ISSN 2079-9268. - 1:1(2011), pp. 97-108.|
|Appare nelle tipologie:||1.1 Articolo in rivista|