This brief presents the unique capabilities of the multimode Dual Mode Logic (DML) design technique to define run-time adaptive datapaths to overcome process and environmental (i.e., temperature and voltage) variations. A proof-of-concept benchmark circuit is designed and fabricated in 65 nm technology. Measurements on 10 test chips, while considering supply voltages spanning 0.6V to 1.2V and temperature variations ranging from -40 °C to 125 °C confirm the effectiveness of this approach to compensate for severe process, voltage and temperature (PVT) variations.

Silicon Evaluation of Multimode Dual Mode Logic for PVT-Aware Datapaths

Lanuzza M.;
2020

Abstract

This brief presents the unique capabilities of the multimode Dual Mode Logic (DML) design technique to define run-time adaptive datapaths to overcome process and environmental (i.e., temperature and voltage) variations. A proof-of-concept benchmark circuit is designed and fabricated in 65 nm technology. Measurements on 10 test chips, while considering supply voltages spanning 0.6V to 1.2V and temperature variations ranging from -40 °C to 125 °C confirm the effectiveness of this approach to compensate for severe process, voltage and temperature (PVT) variations.
adaptive circuits
Dual mode logic (DML)
PVT variation tolerance
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/20.500.11770/310035
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