MACCARONIO, VINCENZO
MACCARONIO, VINCENZO
A Highly Reliable PUF Based on Reconfigurable Sub-Threshold Voltage Divider in 65-nm CMOS
2026-01-01 Vatalaro, M.; De Rose, R.; Maccaronio, V.; Crupi, F.
A Multi-Bit PUF Architecture Using a 2T Sub-Threshold Voltage Divider
2025-01-01 Vatalaro, M.; De Rose, R.; Maccaronio, V.; Lanuzza, M.; Crupi, F.
Design for Reliability of Multi-Bit Operations in RRAM-Based SIMPLY Logic-in-Memory Circuits
2025-01-01 Zanotti, Tommaso; Borellini, Erika; Vatalaro, Massimo; Maccaronio, Vincenzo; Pavan, Paolo; De Rose, Raffaele; Puglisi, Francesco Maria
Design of a Temperature-Aware Voltage Generator for 2-Bit Read Operation in STT-MRAM Based SIMPLY Architecture
2025-01-01 Vatalaro, Massimo; Maccaronio, Vincenzo; Zanotti, Tommaso; Borellini, Erika; Crupi, Felice; Puglisi, Francesco Maria; De Rose, Raffaele
Experimental analysis of variability in WS2-based devices for hardware security
2023-01-01 Vatalaro, M.; Neill, H.; Gity, F.; Magnone, P.; Maccaronio, V.; Marquez, C.; Galdon, J. C.; Gamiz, F.; Crupi, F.; Hurley, P.; De Rose, R.
Highly Stable PUFs Based on Stacked Voltage Divider for Near-Zero BER Native Sensitivity to Voltage Variations
2025-01-01 Vatalaro, M; De Rose, R; Maccaronio, V; Lanuzza, M; Crupi, F
Threshold Voltage Instability and Dielectric Breakdown in Flexible Bottom-Gate Ti/Al2O3/IGZO Thin-Film Transistors
2025-01-01 De Rosis, D.; Vatalaro, M.; Maccaronio, V.; Crupi, F.; Munzenrieder, N.; Catania, F.; Corsino, D.; Cantarella, G.; Petti, L.; De Rose, R.
Threshold Voltage Instability in Flexible Bottom-Gate Al2O3/IGZO TFTs
2024-01-01 De Rosis, D.; Vatalaro, M.; Maccaronio, V.; Crupi, F.; Munzenrieder, N.; Catania, F.; Corsino, D.; Cantarella, G.; Petti, L.; De Rose, R.
| Titolo | Data di pubblicazione | Autore(i) | File |
|---|---|---|---|
| A Highly Reliable PUF Based on Reconfigurable Sub-Threshold Voltage Divider in 65-nm CMOS | 1-gen-2026 | Vatalaro, M.; De Rose, R.; Maccaronio, V.; Crupi, F. | |
| A Multi-Bit PUF Architecture Using a 2T Sub-Threshold Voltage Divider | 1-gen-2025 | Vatalaro, M.; De Rose, R.; Maccaronio, V.; Lanuzza, M.; Crupi, F. | |
| Design for Reliability of Multi-Bit Operations in RRAM-Based SIMPLY Logic-in-Memory Circuits | 1-gen-2025 | Zanotti, Tommaso; Borellini, Erika; Vatalaro, Massimo; Maccaronio, Vincenzo; Pavan, Paolo; De Rose, Raffaele; Puglisi, Francesco Maria | |
| Design of a Temperature-Aware Voltage Generator for 2-Bit Read Operation in STT-MRAM Based SIMPLY Architecture | 1-gen-2025 | Vatalaro, Massimo; Maccaronio, Vincenzo; Zanotti, Tommaso; Borellini, Erika; Crupi, Felice; Puglisi, Francesco Maria; De Rose, Raffaele | |
| Experimental analysis of variability in WS2-based devices for hardware security | 1-gen-2023 | Vatalaro, M.; Neill, H.; Gity, F.; Magnone, P.; Maccaronio, V.; Marquez, C.; Galdon, J. C.; Gamiz, F.; Crupi, F.; Hurley, P.; De Rose, R. | |
| Highly Stable PUFs Based on Stacked Voltage Divider for Near-Zero BER Native Sensitivity to Voltage Variations | 1-gen-2025 | Vatalaro, M; De Rose, R; Maccaronio, V; Lanuzza, M; Crupi, F | |
| Threshold Voltage Instability and Dielectric Breakdown in Flexible Bottom-Gate Ti/Al2O3/IGZO Thin-Film Transistors | 1-gen-2025 | De Rosis, D.; Vatalaro, M.; Maccaronio, V.; Crupi, F.; Munzenrieder, N.; Catania, F.; Corsino, D.; Cantarella, G.; Petti, L.; De Rose, R. | |
| Threshold Voltage Instability in Flexible Bottom-Gate Al2O3/IGZO TFTs | 1-gen-2024 | De Rosis, D.; Vatalaro, M.; Maccaronio, V.; Crupi, F.; Munzenrieder, N.; Catania, F.; Corsino, D.; Cantarella, G.; Petti, L.; De Rose, R. |